Multi-scale, multi-mode imaging tools including light and electron microscopes
Micro- to nanometer-scale structural and property analysis of materials
Produce topographic and compositional images
High resolution imaging without the need of sample preparation
High resolution optical 3D surface measurement for industrial quality assurance
A wide range of roughness measurements, conform to ISO standards
Performance of characterization techniques to map the surface and sub‐surface structure of materials
Quantitative and qualitative analysis of solid materials; metals, polymers, composites, and dry organic matter
2. Deliverables
Imaging and quantitative analysis on solid samples including metals, composites, and organic materials such as polymers, wood, and biological materials
Obtain surface and subsurface imaging of materials; roughness measurements, and identification of different components and phases inside solid materials
Identification of changes occurring at the surface and accurate analysis from observations to support development of new materials and conservation of existing ones
3. Major Equipment and Specific Minor Equipment
Scanning electron microscope: Hitachi Tabletop Microscope TM3030
Magnification up to 120,000X with digital zoom
Observation mode: Standard mode and charge-up reduction mode